Firm Overview
Services
Attorneys &
Patent
Professionals
News &
Information
Helpful Links
Career
Opportunities
Contact Us
|
|
Rayan Alassaad, Ph.D.
Phone: (972) 732-1001
Fax: (972) 732-9218
E-Mail: alassaad@slater-matsil.com
BIOGRAPHY
Rayan Alassaad, Ph.D., has experience in the areas of optical metrology, image and signal processing, microscopy, scatterometry, opto-mechanical design, photonic crystals, diffractive optics, statistical data analysis, inverse problem optimization techniques, and computer modeling. He has served as a Technical Advisor in patent prosecution in different engineering areas, including Telecommunications, Electronic circuits, Systems, and Software.
Rayan worked as a Research Associate in the Nanoscale Integration Lab at the University of Texas at Dallas, as well as in the Optical Instrumentation Lab. He worked with electromagnetic modeling using RCWA and FDTD, as well as critical dimension metrology in semiconductor processing and nanolithography, scatter-field microscopy, and surface Plasmon imaging.
Prior to his work at the University of Dallas, Rayan was a teaching assistant for undergraduate electrical engineering courses at the University, consisting of the Electronic Circuits Lab, Electronics Devices and Advanced Engineering Math. He was a computer programmer at BAB International for several years.
EDUCATION
Rayan obtained a Ph.D. in Electrical Engineering from the University of Texas at Dallas in 2006. He received his Bachelor of Science degree in Computer Science from the Lebanese American University in 1998 and a Masters of Science degree in Electrical Engineering from the University of Texas at Dallas in 2003.
PUBLICATIONS
Rayan’s recent publications include: R.M. Al-Assaad, E.M. Drege, D. M. Byrne, Proc. SPIE 4692, pp. 17-28, 2002, E.M. Drege, J.M. Al-Assaad, D. M. Byrne, Proc. SPIE 4689, pp. 151-162, 2002, R. Al-Assaad and D. Byrne, Op. Soc. Am. A 24, pp. 326-338, 2007, R. M. Al-Assaad, L. Tao and W. Hu, Proc. SPIE 6518, pp. 651839, 2007. R. M. Alassaad, et. al., J. Vac. Sci. Technol. B, in print. R. M. Alassaad, L. Tao, and W. Hu, J. Micro/Nanolith. MEMS MOEMS, in print.
MEMBERSHIPS
Rayan is admitted to practice before the United States Patent and Trademark Office.
|
u